Scanning Probe Microscopy

Key Works

• (Invited: Special Issue on Recent Advances in Nanoindentation, Cover Art) “Quantitative Scanning Probe Microscopy for Nanomechanical Forensics,” F.W. DelRio and R.F. Cook, Exp. Mechanics 57 (2017) 1045-1055.
• (Department of Commerce Bronze Medal Award) “Elastic, adhesive, and charge transport properties of a metal-molecule-metal junction: the role of molecular orientation, order, and coverage,” F.W. DelRio, K.L. Steffens, C. Jaye, D.A. Fischer, and R.F. Cook, Langmuir 26 (2010) 1688-1699.
• “Force measurement using an a.c. atomic force microscope,” W.A. Ducker, R.F. Cook, and D.R. Clarke, J. Appl. Phys. 67 (1990) 4045-4052.

Topical Works

• “Near-theoretical fracture strengths in native and oxidized silicon nanowires,” F.W. DelRio, R.M. White, S. Krylyuk, A.V. Davydov, L.H. Friedman, and R.F. Cook, Nanotechnology 27 (2016) 31LT02-1-7.
• “Interfacial Mechanical Properties of n-Alkylsilane Monolayers on Silicon Substrates,” B.G. Bush, F.W. DelRio, C. Jaye, D.A. Fischer, and R.F. Cook, J. Microelectromechanical Systems 22 (2013) 34-43.
• “Frictional properties of native and functionalized type I collagen thin films,” K.-H. Chung, A.K. Chen, C.R. Anderton, K. Bhadriraju, A.L. Plant, B.G. Bush, R.F. Cook, and F.W. DelRio, Appl. Phys. Letters 103 (2013) 143703-1-5
• “Accurate Spring Constant Calibration for Very Stiff Atomic Force Microscopy Cantilevers,” S.J. Grutzik, R.S. Gates, Y.B. Gerbig, D.T. Smith, R.F. Cook, and A.T. Zehnder, Rev. of Sci. Instruments 84 (2013) 113706-1-8.
• “Nanomechanical Properties of Polyethylene Glycol Brushes on Gold Substrates,” G. Stan, F.W. DelRio, R.I. MacCuspie, and R.F. Cook, J. Physical Chem. B. 116 (2012) 3138-3147.
• “Nanoscale mapping of contact resonance and damping characterization by contact resonance atomic force microscopy,” G. Stan, S.W. King, and R.F. Cook, Nanotechnology 23 (2012) 215703
• “Ultimate bending strength measurements of Si nanowires,” G. Stan, S. Krylyuk, A.V. Davydov, I. Levin, and R.F. Cook, Nano Letters 12 (2012) 2599-2604.
• “Bending manipulation and measurements of fracture strength of silicon and oxidized silicon nanowires by atomic force microscopy,” G. Stan, S. Krylyuk, A.V. Davydov, and R.F. Cook, J. Mater. Res. 27 (2012) 562-570.
• “Structure-property relationships for methyl-terminated alkyl self-assembled monolayers,” F.W. DelRio, C. Jaye, D.A. Fischer, and R.F. Cook, Physical Chem. Letters 512 (2011) 243-246.
• “Prototype cantilevers for quantitative lateral force microscopy,” M.G. Reitsma, L.H. Friedman, R.S. Gates, and R.F. Cook, Rev. Sci. Instruments 82 (2011) 093706
• (Invited) “Probing the Nanoscale,” R.F. Cook, Science 328 (2010) 183-184.
• “Compressive stress effect on the radial elastic modulus of oxidized Si nanowires,” G. Stan, S. Krylyuk, A.V. Davydov, and R.F. Cook, Nano Lett. 10 (2010) 2031-2037.
• “Effect of dehydration on the nanomechanical properties of thin films of collagen,” K.-H. Chung, K. Bhadriraju, T.A. Spurlin, R.F. Cook, and A.L. Plant, Langmuir 26 (2010) 3629-3636.
• (Featured Article, Cover Art) “Elastic Moduli of Faceted Aluminum Nitride Nanotubes Measured by Contact Resonance Atomic Force Microscopy,” G. Stan, C.V. Ciobanu, T.P. Thayer, G.T. Wang, J.R. Creighton, K.P. Purushotham, L.A. Bendersky, and R.F. Cook, Nanotechnology 20 (2009) 035707.
• “Contact-resonance atomic force microscopy for nanoscale elastic property measurements: spectroscopy and imaging,” G. Stan, S. Krylyuk, A.V. Davydov, M.D. Vaudin, L. Bendersky, and R.F. Cook, Ultramicroscopy 109 (2009) 929-936.
• “Elastic modulus of ultrathin low-k dielectric films measured by load-dependent contact-resonance atomic force microscopy,” G. Stan, S.W. King, and R.F. Cook, J. Mater. Res. 24 (2009) 2960-2964.
• “Elastic and adhesive properties of alkanethiol self-assembled monolayers on gold,” F.W. DelRio, C. Jaye, D.A. Fischer, and R.F. Cook, Appl. Phys. Letters 94 (2009) 131909.
• “Origin of Adhesion in Humid Air,” D.-I. Kim, J. Grobelny, N. Pradeep, and R.F. Cook, Langmuir 24 (2008) 1873-1877
• “Mapping the elastic properties of granular Au films by contact resonance atomic force microscopy,” G. Stan and R.F. Cook, Nanotechnology 19 (2008) 235701.
• “Effect of surface proximity on the elastic modulus of Te nanowires,” G. Stan, S. Krylyuk, A. Davydov, M. Vaudin, and R.F. Cook, Appl. Phys. Letters 92 (2008) 241908.
• “Mechanical and Electrical Coupling at Metal-Insulator-Metal Nano-Scale Contacts,” D.-I. Kim, N. Pradeep, F. W. DelRio, R.F. Cook, Appl. Phys. Letters 93 (2008) 203102
• “Diameter-dependent Radial and Tangential Elastic Moduli of ZnO Nanowires,” G. Stan, C.V. Ciobanu, P.M. Parthangal, and R.F. Cook, Nano Letters 7 (2007) 3691-3697.
• “Nanoparticle lithography and imaging using scanning probe microscopy,” J. Grobelny, D.H. Tsai, D.-I. Kim, N. Pradeep, R.F. Cook and M.R. Zachariah, Nanotechnology 17 (2006) 5519-5524.
• “Rapid Measurement of Static and Dynamic Surface Forces,” W.A. Ducker and R.F. Cook, Appl. Phys. Letters 56 (1990) 2408-2410.