Stress Mapping

Review

• “Review: Coefficients for Stress, Temperature, and Composition Effects in Fluorescence Measurements of Alumina,” R.F. Cook and C.A. Michaels, J. Res. Natl Inst. Stan. 122:43 (2017) 1-26.

Key Works

• “Stress measurements in alumina by optical fluorescence: revisited,” R.F. Cook and C.A. Michaels, J. Res. Natl Inst. Stan. 124:124020 (2019).
• “Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on Si,” M.D. Vaudin, W.A. Osborn, L.H. Friedman, J.M. Gorham, and R.F. Cook, Ultramicroscopy 148 (2015) 94-104.
• “Comparison of Nanoscale Measurements of Strain and Stress using Electron Back Scattered Diffraction and Confocal Raman Microscopy,” M.D. Vaudin, Y.B. Gerbig, S.J. Stranick, and R.F. Cook, Appl. Phys. Letters 93 (2008) 193116.

Topical Works

• “Kinematic model of 90° domain boundaries in barium titanate,” R.F. Cook, Zenodo (2020).
• “Microscale mapping of structure and stress in barium titanate,” J.A. Howell, M.D. Vaudin, L.H. Friedman, and R.F. Cook, J. Res. Natl Inst. Stan. 125 (2020) 125013.
• “Lamellar and bundled domain rotations in barium titanate,” J.A. Howell, M.D. Vaudin, L.H. Friedman, and R.F. Cook, J. Mater. Sci. 54 (2019) 116-129.
• “Residual Stress in Polycrystalline Alumina: Comparison of Two-Dimensional Maps and Integrated Scans in Fluorescence-Based Measurements,” C.A. Michaels and R.F. Cook, Acta Mater. 159 (2018) 309-319.
• “Weakly anisotropic residual contact stress in silicon demonstrated by electron backscatter diffraction and an expanding cavity model,” R.F. Cook and L.H. Friedman, Appl. Phys. Letters 113 (2018) 231903-1-4.
• (Cahn Prize: Best Paper of 2017) “Stress and strain mapping of micro-domain bundles in barium titanate using electron backscatter diffraction,” J.A. Howell, M.D. Vaudin, L.H. Friedman, and R.F. Cook, J. Mater. Sci. 52 (2017) 12608-12623.
• “Two-Dimensional Strain-Mapping by Electron Backscatter Diffraction and Confocal Raman Spectroscopy,” A.J. Gayle, L.H. Friedman, R. Beams, B.G. Bush, Y.B. Gerbig, C.A. Michaels, M.D. Vaudin, and R.F. Cook, J. Appl. Phys. 122 (2017) 205101-1-6.
• (Invited: Special Issue on Residual Stress) “Determination of Residual Stress Distributions in Polycrystalline Alumina using Fluorescence Microscopy,” C.A. Michaels and R.F. Cook, Mater. & Design 107 (2016) 478-490.
• “Assessing Strain Mapping by Electron Backscatter Diffraction and Confocal Raman Microscopy Using Wedge-indented Si,” L.H. Friedman, M.D. Vaudin, S.J. Stranick, G. Stan, Y.B. Gerbig, W.A. Osborn, and R.F. Cook, Ultramicroscopy 163 (2016) 75-86.
• “Quantitative Mapping of Stress Heterogeneity in Polycrystalline Alumina using Hyperspectral Fluorescence Microscopy,” G.A. Myers, C.A. Michaels, and R.F. Cook, Acta Mater. 106 (2016) 272-282.
• “Strain mapping of micromachined polycrystalline silicon devices via confocal Raman microscopy,” G.A. Myers, S.S. Hazra, M.P. de Boer, C.A. Michaels, S.J. Stranick, R.P. Koseski, R.F. Cook, and F.W. DelRio, Appl. Phys. Letters 104 (2014) 191908-1-5.
• “Orientation, stress, and strain in an (001) barium titanate single crystal with 90° lamellar domains determined using electron backscatter diffraction,” J.A. Howell, M.D. Vaudin, and R.F. Cook, J. Mater. Sci. 49 (2014) 2213-2224.
• “Micro-scale measurement and modeling of stress in silicon surrounding a tungsten-filled through-silicon via,” R.P. Koseski, W.A. Osborn, S.J. Stranick, F.W. DelRio, M.D. Vaudin, T. Dao, V.H. Adams, and R.F. Cook, J. Appl. Phys. 110 (2011) 073517.
• “High Resolution Surface Morphology Measurements using EBSD Cross-Correlation Techniques and AFM,” M.D. Vaudin, G. Stan, Y.B. Gerbig, and R.F. Cook, Ultramicroscopy 111 (2011) 1206-1213.